USB TDRs and Impedance Analyzers
For over 30 years, HYPERLABS Time Domain Reflectometer (TDR) and Impedance Analyzer instruments have provided high-performance test and measurement capabilities for use in the field or in the lab.
HL1302 Cable Skew Tester
The HL1302 Matched Cable Skew Tester is a USB-connected device measuring the delay difference (skew) between a pair of coaxial cables connected to the Differential Stimulus and Receiver Ports.
After a preliminary calibration of the time base using the first cable and terminations, the skew of the the second cable is transformed as an impulse
on the PC screen. The amplitude is displayed directly as skew in picoseconds.
Using this novel approach, the HL1302 can be used as a replacement for more expensive VNA hardware in matched cable applications
HL300S Ruggedized Controlled Impedance Test System
The HL300S is a complete electrostatic-robust test system designed for easy, cost-effective PCB impedance characterization and verification.
This Test System is designed to comply with IPC-2141A standards for PCB coupon testing, and can be customized to meet specific customer needs.
HL2204 High-speed Signal Path Analyzer
The HL2204 Signal Path Analyzer™ measures TDR, TDT, return loss, and insertion loss in high-speed interconnects, cables, and PCB traces.
With a fast 35 ps rise time and robust software controls, these instruments provide a cost-effective alternative to traditional benchtop test systems.
HL2202 High-speed Signal Path Analyzer
The HL2202 Signal Path Analyzer™ measures TDR, TDT, return loss, and insertion loss in high-speed interconnects, cables, and PCB traces.
With a fast 35 ps rise time and robust software controls, these instruments provide a cost-effective alternative to traditional benchtop test systems.
HL1101 Ruggedized USB TDR
The HL1101 is an electrostatic-robust, USB-driven TDR suitable for deployment in a wide variety of lab, field, and industrial applications.
HL5220 Ruggedized Signal Path Analyzer
The HL5220 Signal Path Analyzer™ measures TDR, TDT, return loss, and insertion loss in high-speed interconnects, cables, and PCB traces.
With a fast 200 ps rise time, ESD robustness, and highly-customizable software controls, these instruments provide a cost-effective alternative to traditional benchtop and factory-floor test systems.
HL5216 Ruggedized Signal Path Analyzer
The HL5216 Signal Path Analyzer™ measures TDR, TDT, return loss, and insertion loss in high-speed interconnects, cables, and PCB traces.
With a fast 200 ps rise time, ESD robustness, and highly-customizable software controls, these instruments provide a cost-effective alternative to traditional benchtop and factory-floor test systems.
HL5208 Ruggedized Signal Path Analyzer
The HL5208 Signal Path Analyzer™ measures TDR, TDT, return loss, and insertion loss in high-speed interconnects, cables, and PCB traces.
With a fast 200 ps rise time, ESD robustness, and highly-customizable software controls, these instruments provide a cost-effective alternative to traditional benchtop and factory-floor test systems.